简(Jian)要(Yao)描(Miao)述(Shu):(?)MAPPING测(Ce)试(Shi)模(Mo)块(Kuai):(?)可(Ke)在(Zai)已(Yi)有(You)的(De)测(Ce)试(Shi)系(Xi)统(Tong)中(Zhong)加(Jia)入(Ru)Mapping的(De)测(Ce)量(Liang)功(Gong)能(Neng),(?)减(Jian)少(Shao)您(Nin)为(Wei)单(Dan)独(Du)采(Cai)购(Gou)表(Biao)面(Mian)均(Jun)匀(Yun)性(Xing)测(Ce)试(Shi)系(Xi)统(Tong)而(?)多(Duo)支(Zhi)付(Fu)的(De)一(Yi)部(Bu)分(Fen)费(Fei)用(Yong)。(?)
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Mapping测(Ce)试(Shi)模(Mo)块(Kuai)可(Ke)在(Zai)已(Yi)有(You)的(De)测(Ce)试(Shi)系(Xi)统(Tong)中(Zhong)加(Jia)入(Ru)Mapping的(De)测(Ce)量(Liang)功(Gong)能(Neng),(?)减(Jian)少(Shao)您(Nin)为(Wei)单(Dan)独(Du)采(Cai)购(Gou)表(Biao)面(Mian)均(Jun)匀(Yun)性(Xing)测(Ce)试(Shi)系(Xi)统(Tong)而(?)多(Duo)支(Zhi)付(Fu)的(De)一(Yi)部(Bu)分(Fen)费(Fei)用(Yong)。(?)
菲(Fei)锐(Rui)科(Ke)技(Ji)成(Cheng)立(Li)于(Yu)2013年(Nian),(?)研(Yan)发(Fa)始(Shi)于(Yu)2006年(Nian)。(?)为(Wei)国(Guo)内(Nei)外(Wai)专(Zhuan)业(Ye)的(De)光(Guang)学(Xue)光(Guang)电(Dian)实(Shi)验(Yan)室(Shi)提(Ti)供(Gong)高(Gao)准(Zhun)确(Que)度(Du)的(De)仪(Yi)器(Qi)用(Yong)于(Yu)产(Chan)品(Pin)测(Ce)试(Shi)、(?)质(Zhi)量(Liang)监(Jian)督(Du)、(?)科(Ke)学(Xue)研(Yan)究(Jiu)等(Deng)各(Ge)种(Zhong)测(Ce)量(Liang)解(Jie)决(Jue)方(Fang)案(An)。(?)
Pharos Technology((?)美(Mei)国(Guo)菲(Fei)锐(Rui)斯(Si)公(Gong)司(Si))(?),(?)主(Zhu)要(Yao)致(Zhi)力(Li)于(Yu)太(Tai)阳(Yang)能(Neng)电(Dian)池(Chi)((?)光(Guang)电(Dian)材(Cai)料(Liao))(?)测(Ce)试(Shi)系(Xi)统(Tong)的(De)研(Yan)发(Fa)、(?)各(Ge)种(Zhong)光(Guang)源(Yuan)、(?)光(Guang)谱(Pu)测(Ce)试(Shi)设(She)备(Bei)、(?)光(Guang)电(Dian)测(Ce)试(Shi)系(Xi)统(Tong)的(De)研(Yan)发(Fa)和(He)生(Sheng)产(Chan)。(?)我(Wo)公(Gong)司(Si)已(Yi)成(Cheng)功(Gong)地(Di)为(Wei)国(Guo)内(Nei)外(Wai)的(De)众(Zhong)多(Duo)家(Jia)权(Quan)wei性(Xing)科(Ke)研(Yan)高(Gao)校(Xiao)和(He)生(Sheng)产(Chan)厂(Chang)商(Shang)提(Ti)供(Gong)了(Liao)太(Tai)阳(Yang)能(Neng)电(Dian)池(Chi)((?)光(Guang)电(Dian)材(Cai)料(Liao))(?)的(De)测(Ce)试(Shi)系(Xi)统(Tong)等(Deng)相(Xiang)关(Guan)产(Chan)品(Pin)。(?)
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